ZEISS Pallet systems

The original by ZEISS


Pallet systems offer a variety of advantages for your everyday measuring tasks:

◾ fixturing of the workpiece apart from the machine - this saves valuable machine capacity for the actual measuring
◾ change pallets in a twinkling - reduce downtime additionally
◾ the workpiece is easily positioned for a repeatable measurement
◾ by means of the calibration pallet, the calibration is made repeatable and in the center of the measuring space, without time-consuming mounting

The pallet system OMEGA is designed for optical measuring machines such as O-INSPECT or O-SELECT.
The pallet system THETA is made for tactile measuring machines, such as bridge type or production cmm
The pallet system GAMMA is designed for the CT measuring machine METROTOM.

We use cookies on this site. Cookies are small text files that are stored on your computer by websites. Cookies are widely used and help to optimize the pages that you view. By using this site, you agree to their use. more